Highest Precision Laser Dilatometer

L75 Laser Dilatometer (DIL) high resolution - CTE

Down

Features Michelson Principle Laser Dilatometer Non contact expansion and shrinkage measurement no calibration needed Any solid sample material (reflecting & not reflecting) Free choice of sample geometry Sample preparation same as with conventional Dilatometer Measurements under inert, oxid., red., vacuum Maximum precision 0,3 Nanometer temperature range -180 up to 1600°C* Induction and heat resistance furnace possible

Description Normally available dilatometers of the series L75 which use the single/double push rod principle of measurement are successfully available in the market since 1957. As a further total new development Linseis is now offering a Laser Dilatometer built after the Michelson-Interferometer principle. Unmatched resolution and absolute accuracy is now possible due to the new development of the Linseis Laser Dilatometer of the Pico-series. As the name indicates already the resolution goes up to Picometers (0,3nm = 300 Picometer). That means resolutions can be obtained which are up to a factor 33,33 higher as the resolution that were possible up to date. On top the principle of interference measurement give the possibility for much higher accuracy's, especially as some special computer calibrations are used. Up to now absolute accuracy's of 1% were normal, with best accuracy's up to 100nm. The new method allows accuracy's up to 30nm. Linseis L75/LASER only needs slight machining of the sample. All you need to do is just prepare one sample, as with the conventional push rod type dilatometer. The system does not require any specific sample geometry. All types of material, reflecting or none reflecting can be evaluated with the system. The measurement principle is an "absolute measurement", not like conventional double sample pushrod Dilatometers, providing much higher precision. No calibration has to be undertake, unlike with conventional Dilatometers. Applications Precision measurement of thermal expansion of low expansion materials such as: carbon, graphite, composites, low expansion glass, amber alloy, quartz glass, etc. Precision measurement of thermal expansion of semiconductor materials. Quality control and quality inspection of materials of which thermal expansion characteristics can be a problem, such as glass, sealing materials, bimetals, materials for precision electronic instruments etc.

Technical specifications Laser Dilatometer Sample length: 20mm Sample Diameter: up to 7mm Temperature range: -180 up to 1600°C* Furnace type: induction or heat resistance Heating/cooling rate: 0.1 up to 100K/s* *different furnaces

Download L75_LASER_DIL_ENG_NET.pdf     Size: 71 KB

Top